The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Feb. 13, 2020
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Huichun Liu, San Diego, CA (US);

Gavin Bernard Horn, La Jolla, CA (US);

Peng Cheng, Beijing, CN;

Xipeng Zhu, San Diego, CA (US);

Karthika Paladugu, San Diego, CA (US);

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 36/00 (2009.01);
U.S. Cl.
CPC ...
H04W 36/0079 (2018.08); H04W 36/0058 (2018.08);
Abstract

Various aspects of the present disclosure generally relate to wireless communication. In some aspects, a user equipment may detect an interruption trigger to initiate reporting of an interruption parameter associated with a dual active protocol stack handover procedure or a conditional handover procedure; and report the interruption parameter to a base station based at least in part on detecting the interruption trigger, wherein the interruption parameter indicates at least one of a duration of handover interruption or a starting time of handover interruption. Numerous other aspects are provided.


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Liu, Huichun. (2026). Interruption measurement for dual active protocol stack handover and conditional handover (U.S. Patent No. 12563459). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12563459

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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