The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Mar. 01, 2023
Applicant:

Panasonic Intellectual Property Corporation of America, Torrance, CA (US);

Inventors:

Yasushi Murakawa, Fukuoka, JP;

Akira Kamogawa, Osaka, JP;

Seiichi Muroya, Osaka, JP;

Hiroyasu Terazawa, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
H04L 63/1425 (2013.01); H04L 63/1416 (2013.01); H04L 63/1458 (2013.01);
Abstract

A detection system includes an obtainer that obtains a first log, the first log being a log of communication in a first network; a determiner that determines whether the first log obtained by the obtainer includes anomaly information indicating anomalous communication in a second network; and a controller that, when the determiner has determined that the first log includes the anomaly information, performs control of notifying of an anomaly in the second network.


Find Patent Forward Citations

Murakawa, Yasushi. (2026). Detection system, detection method, and recording medium (U.S. Patent No. 12563062). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12563062

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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