The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Mar. 09, 2023
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Jun Sakai, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/391 (2015.01); H04B 17/309 (2015.01);
U.S. Cl.
CPC ...
H04B 17/391 (2015.01); H04B 17/309 (2015.01);
Abstract

A radio wave abnormality detection system, a radio wave abnormality detection method, and a radio wave abnormality detection program that are capable of accurately detecting a radio wave abnormality are provided. The radio wave abnormality detection system includes: a determination unit that determines an extraction period, based on a transmission duration estimated from first received data of a radio wave received at a first timing; a learning unit that generates a learned model in which a feature value extracted in the extraction period from second received data of a radio wave received at a second timing is machine-learned; and a detection unit that detects a radio wave abnormality by using a feature value extracted in the extraction period from third received data of a radio wave received at a third timing, and the learned model.


Find Patent Forward Citations

Sakai, Jun. (2026). Radio wave abnormality detection system, radio wave abnormality detection method, and radio wave abnormality detection program (U.S. Patent No. 12562829). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12562829

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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