The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Apr. 18, 2024
Applicant:

SK Hynix Inc., Icheon-si Gyeonggi-do, KR;

Inventor:

Jung Taek You, Icheon-si Gyeonggi-do, KR;

Assignee:

SK hynix Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/156 (2006.01); G11C 7/22 (2006.01);
U.S. Cl.
CPC ...
H03K 5/1565 (2013.01); G11C 7/222 (2013.01); G11C 2207/2254 (2013.01);
Abstract

A semiconductor device includes a duty ratio determination circuit configured to generate a duty information signal in response to receiving a first data clock signal and a second data clock signal in phase or in reverse phase according to a phase selection signal and determining a duty ratio of the first data clock signal and the second data clock signal during a time period when a duty monitoring enable signal for performing a duty monitoring operation is enabled and a selection transfer circuit configured to generate data from the duty information signal and configured to output the data to a controller when a mode register command is enabled.


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Quick Actions:

You, Jung. (2026). Semiconductor system for monitoring results of determination of duty ratio of data clock signals (U.S. Patent No. 12562725). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12562725

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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