The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Jul. 21, 2023
Applicant:

National Chung Cheng University, Chiayi County, TW;

Inventors:

Sheng-Fuh Chang, Chiayi County, TW;

Chia-Chan Chang, Chiayi, TW;

Shih-Cheng Lin, Taitung County, TW;

Wei-Yang Chen, Changhua County, TW;

Yu-Cheng Lin, Taichung, TW;

Assignee:

National Chung Cheng University, Chiayi County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 15/14 (2006.01); H01Q 15/00 (2006.01);
U.S. Cl.
CPC ...
H01Q 15/148 (2013.01); H01Q 15/0086 (2013.01); H01Q 15/147 (2013.01);
Abstract

A method of manufacturing an electromagnetic wave reflecting structure includes the steps of presetting an operating frequency, a reflected wave pointing angle, an incident wave pointing angle, and an incident distance of an electromagnetic wave; obtaining an electromagnetic wave reflecting structure phase distribution of an electromagnetic wave reflecting structure according to the operating frequency, the reflected wave pointing angle, the incident wave pointing angle, and the incident distance; and arranging a plurality of reflecting elements on a substrate according to the electromagnetic wave reflecting structure phase distribution and a reflecting element phase curve of any one of the reflecting elements at the operating frequency.


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