The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Jun. 29, 2023
Trimble Inc., Westminster, CO (US);
Guillaume Clin, Christchurch, NZ;
Stuart Edward Ralston, Christchurch, NZ;
Dylan White, Christchurch, NZ;
Trimble Inc., Westminster, CO (US);
Abstract
Measurement devices such as total stations or laser scanners equipped with camera sensors can capture an image of an environment. An image segmentation model can identify and segment environmental features in the image. The measurement device can display an overlay of the segmented features on top of the image. When a user selects a particular feature, the measurement device can perform point measurements such as scanning to measure a portion of the environment associated with the selected feature. Features in the environment not selected by the user may not be included in the point measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile