The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Apr. 04, 2024
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Youngkwon Lim, McKinney, TX (US);

Rajan Laxman Joshi, San Diego, CA (US);

Madhukar Budagavi, Plano, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 9/00 (2006.01); G06T 17/20 (2006.01); H04N 19/184 (2014.01);
U.S. Cl.
CPC ...
G06T 9/001 (2013.01); G06T 17/20 (2013.01); G06T 17/205 (2013.01); H04N 19/184 (2014.11);
Abstract

An apparatus includes a communication interface configured to receive a compressed bitstream including a base mesh sub-bitstream and a processor operably coupled to the communication interface. The processor is configured to decode a plurality of submeshes from the base mesh sub-bitstream. The processor is also configured to subdivide a submesh of the plurality of submeshes according to a subdivision iteration count to generate at least one subdivided submesh, including determine a number of vertex positions for the at least one subdivided submesh by use of a number of vertices associated with an original submesh and by use of distortion information between the original submesh and a base mesh at each subdivision iteration associated with the subdivision iteration count. The processor is also configured to reconstruct at least a portion of a mesh-frame using the vertex positions corresponding to the at least one subdivided submesh.


Find Patent Forward Citations

Lim, Youngkwon. (2026). Distortion information for each iteration of vertices reconstruction (U.S. Patent No. 12561845). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12561845

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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