The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Jun. 28, 2023
Applicant:

Fluke Corporation, Everett, WA (US);

Inventors:

Roger L. Jungerman, Sebastopol, CA (US);

Mark Galli, Sebastopol, CA (US);

Judd Reed, Sebastopol, CA (US);

Willard S. Macdonald, Sebastopol, CA (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06V 10/44 (2022.01); G06V 20/13 (2022.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06V 10/44 (2022.01); G06V 20/13 (2022.01); G06T 2207/10032 (2013.01); G06T 2207/30184 (2013.01);
Abstract

Methods of determining one or more shading conditions associated with a structure are provided. A method may include determining a first azimuth of a reference roof edge relative to an orientation of a first image of a structure. The method may further include determining a second azimuth of the reference roof edge relative to a second image captured proximate the structure. In addition, the method may include determining one or more shading conditions associated with the structure based on the first azimuth and the second azimuth. Non-transitory computer-readable media is also disclosed.


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