The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Aug. 25, 2021
Goertek Inc., Shandong, CN;
Xiaoman Wang, Shandong, CN;
GOERTEK INC., Shandong, CN;
Abstract
A defect detection method for an LCD screen includes acquiring a screen image of the LCD screen, performing a rough search for defects in the screen image to extract a suspected area where the defects are located, (based on the suspected area) clustering every pixel point in the suspected area to obtain clustering results, and each clustering result corresponds to a suspected defect, and (according to the clustering result) calculating a width and length of the suspected defect corresponding to the clustering result, and determining whether the suspected defect is a screen defect and which type of screen defect it belongs to based on the width and length of the suspected defect. The technical solution of the present disclosure realizes automatic detection of screen defects by rough positioning and accurate positioning of suspected defects, and the detection results are accurate and reliable.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile