The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Sep. 25, 2020
Kokusai Denki Electric Inc., Tokyo, JP;
Keigo Hasegawa, Tokyo, JP;
KOKUSAI DENKI Electric Inc., Tokyo, JP;
Abstract
A technique is provided for detecting the presence or absence of an abnormality with respect to an object appearing in a target image with high accuracy without using AI, even in an environment in which luminance values and colors are likely to fluctuate. An abnormality detection device () includes: an image input unit () for inputting an input image indicating an abnormality detection target object; a gradient distribution generation unit () for dividing the input image into predetermined regions and generating, for each region, a gradient distribution that indicates a distribution of a luminance gradient direction of the region; and an abnormality determination unit () for determining the presence or absence of an abnormality by analyzing the gradient distribution generated for each region.
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