The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Aug. 16, 2024
Applicant:

Fannie Mae, Washington, DC (US);

Inventors:

MD Kabir, Washington, DC (US);

Sundaram Majumdar, Washington, DC (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 21/31 (2013.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/31 (2013.01); G06F 21/552 (2013.01);
Abstract

Disclosed are systems and methods for dynamic application testing. One or more processing circuits receive an application package with an application and authentication information corresponding with group permission states. The one or more processing circuits authenticate access based on the authentication information and group permission states, model testing parameters, and generate indications, with at least one indication corresponding to a simulated breach. The one or more processing circuits retrieve testing parameters via an API, simulate the breach by providing breach data to update a testing parameters state from a first to a second state, and generate an indication for the update. The one or more processing circuits generate and provide a token with authentication information and the indication to a monitoring system, receive an alert identifier from the monitoring system, and generate a data package including the testing parameter, alert identifier, and indication.


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