The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Jan. 20, 2022
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Shaul Dar, Petach Tikva, IL;

Avitan Gefen, Tel Aviv, IL;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/10 (2023.01); G06F 11/34 (2006.01); G06F 18/214 (2023.01); G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G06F 18/10 (2023.01); G06F 11/3409 (2013.01); G06F 18/214 (2023.01); G06N 20/20 (2019.01);
Abstract

Techniques for detecting impactful performance anomalies in storage systems. The techniques include obtaining, for each performance metric of a storage system's workload, a training set of series diffs based on a threshold. Each diff represents a difference between an observed value from an observed set of time series values for the performance metric and a normalized value from a corresponding set of normalized time series values. The techniques include applying the training set of series diffs for each performance metric to an unsupervised anomaly detection algorithm and running the algorithm to identify potentially impactful anomalies in a multi-dimensional search space. The techniques include identifying impactful anomalies from among the potentially impactful anomalies that exceed an anomaly score. In this way, impactful anomalies having a causal effect on multiple performance metrics of the storage system's workload can be identified in a manner less complex and less costly than prior multivariate approaches.


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