The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Sep. 11, 2024
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Dhruv Deepak Upadhyay, San Jose, CA (US);

Yihao Yang, San Jose, CA (US);

Ye Sheng, Fremont, CA (US);

Sudhir Kumar, Dublin, CA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/20 (2019.01); G06F 16/23 (2019.01); G06F 16/27 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 16/2329 (2019.01); G06F 16/27 (2019.01);
Abstract

A durability marker may be advanced according to ordered batches of log records. Different batches of log records may be sent to a distributed data store to update a log stored in the distributed data store. The different batches may be ordered according to a minimum Log Sequence Number (LSN) value within the different batches. The ordered different batches may be used to determine whether and how much to advance a durability marker for the log.


Find Patent Forward Citations

Upadhyay, Dhruv. (2026). Advancing a durability marker for a log according to ordered log record batches (U.S. Patent No. 12561311). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12561311

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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