The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Oct. 27, 2022
Applicant:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Inventors:

Alicia Wen Ju Yurie Leong, Austin, TX (US);

William Robert Alverson, Del Valle, TX (US);

Joshua Taylor Knight, Georgetown, TX (US);

Jerry Anton Ahrens, Sister Bay, WI (US);

Grant Evan Ley, Eden, UT (US);

Anil Harwani, Austin, TX (US);

Amitabh Mehra, Fort Collins, CO (US);

Jayesh Hari Joshi, Austin, TX (US);

Assignee:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/14 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1417 (2013.01); G11C 29/52 (2013.01);
Abstract

Stability testing for memory overclocking is described. In accordance with the described techniques, operation of a memory with overclocked memory settings is testing during a boot up process of a computing device. Test results based on the testing are exposed via a user interface. The test results predict a stability of the memory over a subsequent time period if the memory is configured to operate with the overclocked memory settings.


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