The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Jun. 15, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Reiso Sasaki, Tokyo, JP;

Kazuo Ono, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G01K 1/024 (2021.01); H04W 52/02 (2009.01);
U.S. Cl.
CPC ...
G05B 19/41865 (2013.01); G01K 1/024 (2013.01); H04W 52/0251 (2013.01); G05B 2219/50185 (2013.01);
Abstract

An automatic inspection system includes a wireless slave device and a wireless master device. The wireless slave device includes a sound collection unit that collects sound generated from an inspection target object, an analysis unit that analyzes the collected sound to obtain a degree of difference between the collected sound and normal sound learned in advance and sound state information of the collected sound, as an analysis result, a wireless communication unit that wirelessly transmits data including the analysis results to a wireless master device, and a power supply unit that supplies power to the sound collection unit, the analysis unit, and the wireless communication unit. The wireless master device is configured to perform processing of receiving and managing the data from the wireless slave device, and transmitting the analysis result extracted from the data to a monitoring terminal that monitors a state of the inspection target object.


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