The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Apr. 20, 2022
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Gao Yang, Singapore, SG;
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Abstract
A microscope system with a corresponding control system, method and computer program. The microscope system includes a microscope that generates images of a sample being arranged on a sample stage. The microscope system has a sample stage that carries the sample. The sample stage has a visual marker. The method uses an optical imaging sensor that provides image data of an image showing the visual marker of the sample stage. The method uses a control system that determines a position of the sample stage based on the image data of the image showing the visual marker.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile