The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Apr. 27, 2022
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Sheng-Li Chang, Zhubei, TW;

Chi Shen Chang, Zhubei, TW;

Chih-Cheng Hsu, Miaoli County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/12 (2006.01); G02B 21/34 (2006.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G02B 21/125 (2013.01); G02B 21/34 (2013.01); G06V 20/69 (2022.01);
Abstract

A microscopic observation method configured to observe a specimen in a specimen carrier that includes the following steps: placing the specimen carrier at an observation point; obtaining a length of the specimen carrier along a movement direction, a thickness of the specimen carrier along an observation direction of a microscope objective, an observation angle of the microscope objective, and a relative distance between a lateral surface of the specimen carrier and the microscope objective along the movement direction; and adjusting an incident angle of a light beam emitted from a dark-field illumination towards the specimen carrier according to a calculation result of the length, the thickness, the observation angle, and the relative distance.


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