The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Aug. 31, 2023
Kabushiki Kaisha Toshiba, Tokyo, JP;
Kenta Takanashi, Kawasaki Kanagawa, JP;
Hiroya Kano, Kawasaki Kanagawa, JP;
Hiroshi Ohno, Tokyo, JP;
Hideaki Okano, Yokohama Kanagawa, JP;
KABUSHIKI KAISHA TOSHIBA, Kawasaki Kanagawa, JP;
Abstract
According to the embodiment, an optical measurement method includes: forming an object image including at least a part of the object by a bright-field optical system, and capturing and acquiring object image data by an imaging element configured to distinguish spectrums including first and second wavelengths by each pixel; performing dark-field conversions for the first wavelength to obtain first converted image data and for the second wavelength to obtain second converted image data, based on the object image data; performing hue generation processing of generating hue image data based on the first and second converted image data; and estimating information regarding a physical property of the object based on the hue image data.