The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Feb. 22, 2024
Siemens Healthineers Ag, Forchheim, DE;
Wei Liu, Erlangen, DE;
Kun Zhou, Shenzhen, CN;
Nan Xiao, Shenzhen, CN;
Simon Bauer, Baunach, DE;
Adam Kettinger, Erlangen, DE;
Siemens Healthineers AG, Forchheim, DE;
Abstract
Techniques are provided for performing echo planar imaging (EPI) data correction. This includes obtaining positive and negative readout gradient calibration data of an imaging target through non-accelerated EPI acquisitions; respectively adopting first and second DPG kernels to be fitted and respectively used to eliminate phase errors of positive and negative readout gradients to fit the positive and negative readout gradient calibration data of the imaging target, with the fitting targets being positive and negative readout gradient data, respectively, in ghost-free target ACS data, and obtaining, after the fitting, a first and a second DPG kernel for final use; obtaining imaging data of the imaging target through an EPI acquisition; adopting the first and second DPG kernels to correct the phase errors of the imaging data to obtain phase-error-free imaging data.