The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

May. 31, 2023
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Lei Ding, Plano, TX (US);

Elie Libbos, Champaign, IL (US);

Srinath Ramaswamy, Murphy, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/00 (2006.01); G01R 33/09 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0035 (2013.01); G01R 33/0017 (2013.01); G01R 33/09 (2013.01);
Abstract

In one example, a calibration method includes receiving, from a sensor proximate a first conductor, a sensor signal representing a measurement of a magnetic field produced based on a first current flowing in the first conductor and a second current flowing in a second conductor, the first current including first and second current components having different frequencies, and the second current including third and fourth current components, the third current component phase shifted from, and having the same frequency as, the first current component and the fourth current component having a different frequency from the third current component, determining reference values of the first and second currents, and based on the sensor signal and the reference values of the first and second currents, determining for the sensor, a plurality of coupling coefficients representing magnetic field coupling between the first and second conductors.


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