The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Mar. 01, 2024
Applicant:

The Adt Security Corporation, Boca Raton, FL (US);

Inventor:

Jeron E. Bornstein, Delray Beach, FL (US);

Assignee:

The ADT Security Corporation, Boca Raton, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2834 (2013.01); G01R 31/287 (2013.01); G01R 31/2874 (2013.01);
Abstract

A system for testing a sensor and a hub is provided. The system includes a testing control device and a sensor testing device. The testing control device is configured to select a testing profile based at least in part on the sensor, and transmit a testing initiation signal based at least in part on the testing profile. The sensor testing device is configured to perform testing of the sensor and the hub in response to the testing initiation signal, the testing including rotating the sensor along at least one axis based at least in part on the testing profile, and transmit test data to the testing control device based at least in part on the testing of the sensor and the hub. The testing control device is configured to receive the test data from the sensor testing device.


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