The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Sep. 05, 2023
Applicant:

Ul Llc, Northbrook, IL (US);

Inventors:

Maan Ghanma, Millbrae, CA (US);

Ekta Budhbhatti, San Jose, CA (US);

Barry Klinger, Milpitas, CA (US);

Robert Causey, Gilroy, CA (US);

Assignee:

UL LLC, Northbrook, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0821 (2013.01); G01R 29/0871 (2013.01);
Abstract

A test apparatus includes a test chamber or open area test site configured to receive a device under test and a test fixture located in the test chamber. The test fixture includes at least one fixture antenna. The test apparatus further includes a positioner located within the test chamber. The positioner is configured to support the device under test and rotate the device under test at least 180 degrees about a vertical axis of the test chamber.


Find Patent Forward Citations

Ghanma, Maan. (2026). Test system and apparatus for over-the-air testing of devices and antennas (U.S. Patent No. 12560635). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12560635

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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