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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12560632 B1

PDFFull Text
Date of Patent:
Feb. 24, 2026

Filed:

Aug. 28, 2020

State estimation system and state estimation method for power conversion semiconductor apparatus

Applicants:

Toshiba Mitsubishi-electric Industrial Systems Corporation, Chuo-ku, JP;

Kyushu Institute of Technology, Kitakyushu, JP;

Inventors:

Haruyuki Yamaguchi, Tokyo, JP;

Makoto Mukunoki, Tokyo, JP;

Masahiko Tsukakoshi, Tokyo, JP;

Ichiro Omura, Kitakyushu, JP;

Masanori Tsukuda, Kitakyushu, JP;

Li Guan, Suzuka, JP;

Kazuha Watanabe, Kitakyushu, JP;

Assignees:

TMEIC CORPORATION, Chuo-ku, JP;

KYUSHU INSTITUTE OF TECHNOLOGY, Kitakyushu, JP;

Attorney:

Oblon, McClelland, Maier & Neustadt, L.L.P.

Primary Examiner:

Lam S Nguyen

Int. Cl.
CPC ...
G01R 19/10 (2006.01); H02M 1/00 (2006.01); H02M 1/08 (2006.01); H02M 7/5387 (2007.01);
U.S. Cl.
CPC ...
G01R 19/10 (2013.01); H02M 1/0009 (2021.05); H02M 1/08 (2013.01); H02M 7/53871 (2013.01);
Abstract

A state estimation system for a power conversion semiconductor apparatus in an embodiment includes an analysis processing unit and an estimation processing unit. The analysis processing unit projects points indicating a combination of a voltage detection value in first time history data of a voltage between the pair of main terminals detected when the pair of main terminals are forward-biased and when the pair of main terminals are reverse-biased and a current detection value in second time history data of detection values of both a forward current and a reverse current between the pair of main terminals onto a coordinate plane including a voltage axis and a current axis on the basis of the first time history data and the second time history data in the power conversion semiconductor apparatus including the pair of main terminals and derives a distribution of the projected points on the coordinate plane. An estimation processing unit estimates a state of the power conversion semiconductor apparatus on the basis of a distribution of the projected points.

Find Patent Forward Citations

Yamaguchi, Haruyuki. (2026). State estimation system and state estimation method for power conversion semiconductor apparatus (U.S. Patent No. 12560632). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12560632

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