The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

May. 19, 2021
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Makoto Nogami, Tokyo, JP;

Yushi Harada, Tokyo, JP;

Yuichiro Hashimoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1011 (2013.01); G01N 35/1097 (2013.01);
Abstract

A control method for an automatic analyzer that can improve robustness, throughput, and measurement accuracy. The automatic analyzer includes a sample loop connected between two sample ports of a plurality of sample ports of a switch valve. The method includes the steps of: adjusting a drive parameter of the syringe corresponding to a viscosity of the sample acquired in advance; switching the switch valve to a first state in which the sipper and the syringe contact with each other without through the sample loop; driving the syringe based on the drive parameter to draw and introduce the sample through the sipper; switching the switch valve to a second state in which the syringe and the sample loop conduct with each other; and driving the syringe based on the drive parameter to introduce the sample into the sample loop.


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