The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
May. 02, 2024
Applied Materials, Inc., Santa Clara, CA (US);
Asaf Schlezinger, Modiin, IL;
Applied Materials Inc., Santa Clara, CA (US);
Abstract
Methods and apparatus of inspection tools for inspecting impurities in vials are provided herein. In some embodiments, an inspection tool for inspecting impurities in vials includes: a motor; a plurality of carts configured to move via the motor to selectively place each of the plurality of carts in an inspection position, wherein each of the plurality of carts includes a vial holder configured to hold a plurality of vials, and wherein each vial holder is configured to spin the plurality of vials on their own respective axes; and a camera configured to take an image of at least one of the plurality of vials of a corresponding cart of the plurality of carts when the corresponding cart is disposed in the inspection position.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile