The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Sep. 22, 2023
Honeywell International Inc., Charlotte, NC (US);
Chen Feng, Mount Laurel, NJ (US);
Moin Shafai, Richardson, TX (US);
Suresh Venkatarayalu, Waxhaw, NC (US);
Honeywell International Inc., Charlotte, NC (US);
Abstract
An example apparatus, method, and computer program product for detecting a change (e.g., deformation) in a surface using optical fibers are provided. The example apparatus may include an optical fiber having a first end and a second end, wherein the optical fiber is positioned in a two-dimensional pattern on a surface. An illumination source is positioned at a first end of the optical fiber and is configured to emit a light output into the first end of the optical fiber. A first optical receiver is also positioned at the first end of the optical fiber, configured to receive reflected light. The apparatus may include a second optical receiver configured to receive transmitted light at the second end of the optical fiber. A change in the surface is detected based at least in part on the reflected light and the transmitted light.