The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Feb. 21, 2020
Technische Universität Wien, Vienna, AT;
TECHNISCHE UNIVERSITÄT WIEN, Vienna, AT;
Abstract
A method for determining optical properties of a sample material includes: determining a first intensity of light in a first polarization state that was reflected by the sample material; determining a second intensity of the light in a second polarization state that was reflected by the sample material; forming the ratio between the first intensity and the second intensity, or vice versa. Further, an apparatus for determining optical properties of a sample material, comprising at least one detector device for determining a first intensity of light in a first polarization state that was reflected by the sample material and for determining a second intensity of the light in a second polarization state that was reflected by the sample material and at least one computing unit for forming the ratio of the first intensity and the second intensity, or vice versa.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile