The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Sep. 12, 2022
Sukup Manufacturing Co., Sheffield, IA (US);
Casey Scott Heilskov, Hampton, IA (US);
Matthew Koch, Clear Lake, IA (US);
David Jay Brownmiller, Mason City, IA (US);
Ryan Eilertson, Sheffield, IA (US);
SUKUP MANUFACTURING CO., Sheffield, IA (US);
Abstract
A system is presented for evaluating grain in a grain handling system. The system includes a sensor system and a sample conveyor system. In one or more arrangements, the sensor system is operatively connected to the grain handling system and includes an optical sensor. The sample conveyor system is configured to collect samples of grain in the grain handling system, deliver the samples of grain to the sensor system, and remove the samples of grain from the sensor system. The sensor system is configured to measure characteristics of the samples of grain delivered to the sensor system by the sample conveyor system. In one or more arrangements, the system includes a cleaning system configured to clean the optical sensor, the lens; and/or other components of the sensor system. In one or more arrangements, the system includes a recalibration system configured to recalibrate the optical sensor.