The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Jan. 28, 2022
Applicant:
Klingelnberg Gmbh, Hückeswagen, DE;
Inventors:
Markus Finkeldey, Hattingen, DE;
Jonas Stefer, Wipperfürth, DE;
Assignee:
KLINGELNBERG GMBH, Hückeswagen, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 13/021 (2019.01); G01B 5/008 (2006.01); G01B 11/00 (2006.01); G01B 11/02 (2006.01); G01B 11/08 (2006.01); G01B 11/14 (2006.01); G01B 11/24 (2006.01); G01B 11/26 (2006.01);
U.S. Cl.
CPC ...
G01M 13/021 (2013.01); G01B 5/008 (2013.01); G01B 11/00 (2013.01); G01B 11/005 (2013.01); G01B 11/02 (2013.01); G01B 11/08 (2013.01); G01B 11/14 (2013.01); G01B 11/24 (2013.01); G01B 11/2416 (2013.01); G01B 11/2433 (2013.01); G01B 11/26 (2013.01);
Abstract
A method having the steps of measuring a geometry of a toothing using an optical measuring system, wherein a numerical aperture of the optical measuring system is adjustable and the numerical aperture of the optical measuring system is adapted depending on at least one geometric parameter of the toothing to be measured and/or is enlarged or reduced.