The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Aug. 27, 2020
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Yuma Matsuda, Tokyo, JP;
Tomoyuki Hino, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 7/02 (2006.01); E01D 22/00 (2006.01); G01D 5/353 (2006.01); G01H 9/00 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 7/025 (2013.01); E01D 22/00 (2013.01); G01D 5/35354 (2013.01); G01H 9/004 (2013.01); G01M 99/00 (2013.01);
Abstract
Provided is an optical fiber sensor that is capable of highly accurately detecting an abnormality in a structure from vibration information. This optical fiber sensor includes an optical fiber that is laid in the vicinity of a structure, a light source for introducing pulsed light of a specific period into the optical fiber, and an optical sensor for detecting return light that has been obtained as a result of the introduction of the pulsed light into the optical fiber. The structure is determined to have an abnormality if the spectral centroid of vibration information exceeds a threshold.