The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

May. 13, 2022
Applicant:

Hoffmann-la Roche Inc., Little Falls, NJ (US);

Inventors:

Karen Aechtler, Mannheim, DE;

Thomas Raetz, Mannheim, DE;

Gerald Zieres, Mannheim, DE;

Assignee:

Hoffmann-La Roche Inc., Little Falls, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/00 (2006.01); G01J 5/00 (2022.01); G01M 3/22 (2006.01);
U.S. Cl.
CPC ...
G01M 3/002 (2013.01); G01J 5/0014 (2013.01); G01M 3/227 (2013.01); G01J 2005/0077 (2013.01);
Abstract

Disclosed is a method of integrity testing of a single-use system for processing a fluidic material. In the inventive method, a single-use system for processing at least one fluidic material is provided. The single-use system has at least one plastic component. A test gas is applied to a lumen of the single-use system. The test gas has one or more of spectral absorption or spectral emission properties in the infrared spectral range distinguishable from ambient air. At least a part of the single-use system is monitored using an infrared camera. A method of processing a fluidic material by using a single-use system and a test system for integrity testing of a single-use system are also disclosed.


Find Patent Forward Citations

Loading…