The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Aug. 31, 2021
Applicant:

Hitachi Astemo, Ltd., Hitachinaka, JP;

Inventors:

Kenji Yoshihara, Hitachinaka, JP;

Hiroyuki Abe, Hitachinaka, JP;

Tsukasa Takahashi, Hitachinaka, JP;

Takeo Hosokawa, Hitachinaka, JP;

Assignee:

HITACHI ASTEMO, LTD., Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/22 (2006.01); G01M 17/02 (2006.01); B60C 19/00 (2006.01);
U.S. Cl.
CPC ...
G01L 1/2231 (2013.01); G01M 17/02 (2013.01); B60C 2019/004 (2013.01);
Abstract

An object of the present invention is to provide a strain amount detection device capable of accurately detecting deformations, in multiple directions, of a tire by one strain measuring element. A strain amount detection device according to the present invention includes a disk-shaped base member that holds a strain measuring element, in which the base member acts as a strain body by transmitting strain of a tire to the strain measuring element.


Find Patent Forward Citations

Yoshihara, Kenji. (2026). Strain amount detection device, and tire (U.S. Patent No. 12560497). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12560497

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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