The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Nov. 26, 2021
Applicant:

Compagnie Generale Des Etablissements Michelin, Clermont-Ferrand, FR;

Inventor:

Vianney Leroy, Clermont-Ferrand, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/14 (2006.01); G01B 7/02 (2006.01); G01B 7/14 (2006.01); G01B 7/26 (2006.01);
U.S. Cl.
CPC ...
G01D 5/145 (2013.01); G01B 7/023 (2013.01); G01B 7/14 (2013.01); G01B 7/26 (2013.01);
Abstract

A device for measuring the distance between two substantially parallel surfaces of an object comprises an electronic apparatus with a Hall effect sensor. The device comprises a mechanical decoupling system which isolates the object to be measured from the measuring apparatus so as to eliminate interactions that can disrupt the measurement. This device can be applied to the measurement of the thickness of a layer of rubber for a tire, and more particularly to the measurement of the remaining thickness of a tread.


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Leroy, Vianney. (2026). Measurement device comprising a system for mechanically uncoupling a hall effect sensor (U.S. Patent No. 12560457). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12560457

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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