The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

Oct. 17, 2019
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Kai Hsu, Sugar Land, TX (US);

Thomas Pfeiffer, Katy, TX (US);

Kang Wang, Houston, TX (US);

Dan Schulz, Houston, TX (US);

Morten Kristensen, Cambridge, MA (US);

Youxiang Zuo, Burnaby, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 49/08 (2006.01); E21B 49/10 (2006.01); G01N 21/31 (2006.01); G01N 21/59 (2006.01); G01N 21/85 (2006.01); G01N 21/94 (2006.01);
U.S. Cl.
CPC ...
E21B 49/0875 (2020.05); E21B 49/10 (2013.01); G01N 21/31 (2013.01); G01N 21/5907 (2013.01); G01N 21/8507 (2013.01); G01N 21/94 (2013.01);
Abstract

A method includes receiving first fluid property data from a sample flowline of a focused sampling system and receiving second fluid property data from a guard flowline of the focused sampling system. The sample flowline and the guard flowline are each configured to sample formation fluid from a hydrocarbon reservoir, the formation fluid includes native formation fluid and a contaminant, and the first fluid property data includes an optical density of the native formation fluid and the second fluid property data includes an optical density of the contaminant


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