The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2026

Filed:

May. 11, 2021
Applicant:

Trumpf Laser- Und Systemtechnik Gmbh, Ditzingen, DE;

Inventors:

Frederik Schaal, Fellbach, DE;

Matthias Allenberg-Rabe, Ludwigsburg, DE;

Valentin Blickle, Stuttgart, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/342 (2014.01); B22F 10/25 (2021.01); B22F 10/28 (2021.01); B22F 10/36 (2021.01); B22F 10/366 (2021.01); B22F 10/39 (2021.01); B22F 10/85 (2021.01); B22F 12/41 (2021.01); B22F 12/43 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B23K 26/342 (2015.10); B22F 10/28 (2021.01); B22F 10/366 (2021.01); B22F 10/39 (2021.01); B22F 10/85 (2021.01); B22F 12/43 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B22F 10/25 (2021.01); B22F 10/36 (2021.01); B22F 12/41 (2021.01);
Abstract

Methods for detecting a working area of a generative manufacturing device and manufacturing devices for generatively manufacturing components from a powder material are disclosed. The methods include scanning of an optical working beam of the generative manufacturing device in the working area, detecting signal values of remitted light of the optical working beam traveling along an optical axis of the optical working beam in a location-dependent manner, wherein a signal value is assigned to each location of the scan of the optical working beam in the working area, and obtaining an image of the working area from the location-dependent detected signal values. The optical working beam for detecting the working area is operated with an optical output power that is reduced compared to a lower power limit for the optical output power of the optical working beam used during generative manufacturing.


Find Patent Forward Citations

Schaal, Frederik. (2026). Methods for detecting a working area of a generative manufacturing device and manufacturing devices for generatively manufacturing components from a powder material (U.S. Patent No. 12558742). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12558742

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…