The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Apr. 20, 2023
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Michael Totzeck, Schwaebisch Gmuend, DE;
Frank Widulle, Neu-Ulm, DE;
Christian Platt, Ulm, DE;
Beat Marco Mout, Aalen, DE;
Diana Spengler, Aalen, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A method for additive manufacturing includes obtaining a dataset that defines the workpiece in multiple workpiece layers arranged one on top of the other. A layer stack of multiple workpiece layers is produced based on the dataset. The layer stack has a respective topmost workpiece layer at a defined instant of time. The layer stack is thermally excited at the defined instant of time and a sequence of images of the respective topmost workpiece layer is recorded. The layer stack is inspected using the sequence of images. The inspection involves evaluation of an individual temporal deformation profile of the respective topmost workpiece layer in response to the thermal excitation. The individual temporal deformation profile has multiple characteristic features including an individual deformation increase, an individual deformation maximum, and an individual deformation decrease. The inspection result is determined by evaluating at least one of the characteristic features.