The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2026
Filed:
Mar. 26, 2019
Haag-streit Ag, Köniz, CH;
Claudio Dellagiacoma, Bern, CH;
Frank Zumkehr, Zollikofen, CH;
Haag-Streit AG, Köniz, CH;
Abstract
In order to measure at least one geometric parameter of an eye, Purkinje reflections from blue and infrared light sources are recorded with a microscope and a camera. Due to the dispersion of the optics of the microscope, at least one set of reflections is defocused. By measuring the radii of the reflections, the offset of the camera from an ideal focusing position or another distance parameter can be calculated. The distance parameter can e.g. be used to correct the magnification factor of the microscope even if the microscope is a non-telecentric microscope. For example, it can be used to carry out more accurate keratometry measurement using a non-telecentric microscope and/or non-telecentric illumination.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile