The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Oct. 11, 2022
Hewlett Packard Enterprise Development Lp, Spring, TX (US);
Junpeng Wu, Beijing, CN;
Zhonglin Feng, Beijing, CN;
Xiumeng Wang, Beijing, CN;
Meng Zhao, Beijing, CN;
Yiting Zheng, Beijing, CN;
Sachin Ganu, Beijing, CN;
Denis Houle, St. Laurent, CA;
Hewlett Packard Enterprise Development LP, Spring, TX (US);
Abstract
Examples of performing selective Fine Timing Measurement (FTM) are described. For an FTM scan cycle, a first AP (i.e., an initiator) may determine scanning parameter values of a plurality of second APs (i.e., potential responders) based on previously performed FTM scans. The first AP may determine weights of the plurality of second APs based on the scanning parameter values and select a set of target APs based on the weights. The first AP may then scan the set of target APs for the FTM scan so that the rest of the plurality of second APs are relieved from participating in the FTM scan thereby reducing the performance impact on the rest of the plurality of second APs. After the FTM scan cycle is completed, the first AP may update the weights and select another set of target APs based on the updated weights to perform another FTM scan cycle.