The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Nov. 29, 2017
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Jeffrey Matthew Kempf, Dallas, TX (US);

Vikrant R. Bhakta, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/189 (2018.01); G01B 11/25 (2006.01); G02B 26/08 (2006.01); G06T 7/521 (2017.01); H04N 13/204 (2018.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
H04N 13/189 (2018.05); G01B 11/2513 (2013.01); G02B 26/0833 (2013.01); G06T 7/521 (2017.01); H04N 13/204 (2018.05); H04N 23/56 (2023.01);
Abstract

Described examples include an imager includes a light source; a spatial light modulator to receive light from the light source and to provide patterned light to illuminate an object; a sensor to receive a first and an offset reflected light from reflection of the patterned light off an object; and a processor to receive sensed images of the first reflected light and the offset reflected light and apply a deconvolution to a combined image including a combination of the sensed images of the first reflected light and the offset reflected light to generate the combined image having pixel density greater than the sensed images of the first reflected light and the offset reflected light, wherein the processor is configured to determine a position of at least one point on the object by triangulation between the spatial light modulator and the sensor using the patterned light and the combined image.


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