The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Oct. 24, 2023
Samsung Sds Co., Ltd., Seoul, KR;
Eun Kyung Kim, Seoul, KR;
Chang Hoon Lee, Seoul, KR;
Hyo Jin Yoon, Seoul, KR;
Ji Hoon Cho, Seoul, KR;
SAMSUNG SDS CO., LTD., Seoul, KR;
Abstract
Provided are a method for analyzing quantum vulnerability and a system therefor. The method according to some embodiments may include configuring quantum-vulnerable algorithm detection rule based on a type of encryption algorithm, configuring an analysis level for analyzing a quantum vulnerability of target software, from among a plurality of predefined analysis levels, analyzing the target software based on the configured quantum-vulnerable algorithm detection rule, using an analysis technique corresponding to the configured analysis level, and assessing the quantum vulnerability of the target software based on a result of the analyzing.