The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
May. 22, 2024
Applicant:
Keysight Technologies, Inc., Santa Rosa, CA (US);
Inventor:
David L. Gines, Fort Collins, CO (US);
Assignee:
KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/20 (2006.01);
U.S. Cl.
CPC ...
H04L 1/205 (2013.01);
Abstract
A method for measuring even/odd jitter (EOJ) in digital signals includes receiving a signal under test (SUT), where the SUT includes a waveform of even symbols and odd symbols constituting an even-length test pattern. The method further includes generating a first pulse-fit vector for the even symbols of the waveform and a second pulse-fit vector for odd symbols of the waveform, and determining the EOJ of the SUT by measuring and comparing respective widths of the first and second pulse-fit vectors.