The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Jun. 03, 2022
Applicant:
Cornell University, Ithaca, NY (US);
Inventors:
Jie Pei, Greenville, TX (US);
Susan P. Ashdown, Ithaca, NY (US);
Assignee:
CORNELL UNIVERSITY, Ithaca, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 19/20 (2011.01); G06T 7/11 (2017.01); G06T 7/73 (2017.01); G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06T 19/20 (2013.01); G06T 7/11 (2017.01); G06T 7/74 (2017.01); G06T 11/203 (2013.01); G06T 2200/24 (2013.01); G06T 2207/30196 (2013.01); G06T 2207/30204 (2013.01); G06T 2210/16 (2013.01); G06T 2219/2004 (2013.01); G06T 2219/2016 (2013.01); G06T 2219/2021 (2013.01);
Abstract
Methods, device, system and one or more computer readable media having one or more computer programs with instructions to generate custom-fit garment patterns from a 3D body scan are disclosed. The patterns may be obtained by unwrapping the 3D body scan (3D image) into 2D using defined datapoints associated with the surface of a body in a target region. Patterns may be generated for different types of garments. The custom-fit garment patterns generated from the 3D body scan may be basic patterns, which may be further customized or modified as desired.