The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Mar. 26, 2024
Applicant:
Outward, Inc., San Jose, CA (US);
Inventors:
Clarence Chui, Los Altos Hills, CA (US);
Manu Parmar, Sunnyvale, CA (US);
Brook Aaron Seaton, Fremont, CA (US);
Himanshu Jain, Milpitas, CA (US);
Assignee:
Outward, Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/20 (2011.01); G06T 5/50 (2006.01); G06T 7/32 (2017.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 15/205 (2013.01); G06T 5/50 (2013.01); G06T 7/32 (2017.01); G06T 17/00 (2013.01);
Abstract
Techniques for generating an arbitrary view or perspective of an ensemble scene are disclosed. In some embodiments, in response to a received request for a prescribed perspective of an ensemble scene comprising a plurality of assets, an output image of the ensemble scene that approximates the requested prescribed perspective is generated using existing images of the plurality of assets.
Chui, Clarence. (2026). Arbitrary view generation (U.S. Patent No. 12555312). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12555312
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile