The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Mar. 08, 2023
Samsung Electronics Co., Ltd., Suwon-si, KR;
Alexandra Dana, Tel-Aviv, IL;
Amit Shomer, Tel-Aviv, IL;
Nadav Carmel, Tel-Aviv, IL;
Tomer Peleg, Tel-Aviv, IL;
Assaf Tzabari, Tel-Aviv, IL;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
The present disclosure provides architectures and techniques for absolute depth estimation from a single (e.g., monocular) image, using online depth scale transfer. For instance, estimation of up-to-scale depth maps from monocular images may be decoupled from estimation of the depth scale (e.g., such that additional online measurements, additional calibrations, etc. are not required). One or more aspects of the present disclosure include fine-tuning or training from scratch an absolute depth estimator using collected monocular images, as well as existing images and absolute depth measurements (e.g., from additional setups, such as LiDAR/stereo sensors). Collected monocular images may be used to create up-to-scale depth maps, and existing images and absolute depth measurements may be used to estimate the scale of a scene from the up-to-scale depth map. Scale transfer may thus be achieved between source images with known ground truth depth information and a new target domain of collected monocular images.