The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Nov. 16, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Pedro Luis Esquinas Fernandez, Etobicoke, CA;

Giovanni John Jacques Palma, Chaville, FR;

Omid Bonakdar Sakhi, North York, CA;

Paul Dufort, Toronto, CA;

Thomas Binder, Fontenay-sous-bois, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 9/54 (2006.01); G06N 5/01 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06F 9/542 (2013.01); G06N 5/01 (2023.01); G06T 2207/20081 (2013.01);
Abstract

In an approach for automatically detecting whether an output of a detection and segmentation algorithm is of an acceptable quality, a processor receives an image. A processor applies a detection stage of a detection and segmentation algorithm to the image. A processor computes a set of features from a detection score map output by the detection stage of the detection and segmentation algorithm by analyzing the detection score map at more than one different operating points. A processor inputs the set of features into a classifier that predicts whether a final output of the detection and segmentation algorithm will be of an acceptable quality, wherein the acceptable quality is defined based on whether a detection precision threshold has been reached. A processor receives an output of the classifier.


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