The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Jul. 27, 2023
Applicant:

Dionex Corporation, Sunnyvale, CA (US);

Inventors:

Yongjing Chen, Santa Clara, CA (US);

Yan Liu, Palo Alto, CA (US);

Husam Al-Esawi, El Dorado Hills, CA (US);

Assignee:

Dionex Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/0633 (2023.01); G06V 30/224 (2022.01); G08B 21/18 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/0633 (2013.01); G06V 30/224 (2022.01); G08B 21/18 (2013.01);
Abstract

Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, samples are tracked using unique identifiers. An autosampler may detect the samples using unique identifiers and provide alerts when the sample is placed in the wrong location or when an incorrect or incompatible workflow is selected for the sample.


Find Patent Forward Citations

Chen, Yongjing. (2026). Sample tracking workflow and method (U.S. Patent No. 12555056). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12555056

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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