The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Aug. 17, 2022
Hierarchical data labeling for machine learning using semi-supervised multi-level labeling framework
Accenture Global Solutions Limited, Dublin, IE;
Maziyar Baran Pouyan, Emeryville, CA (US);
Mary A. Ohara, Newark, DE (US);
Manish Khati, Hyderabad, IN;
Srikant Vilas Khole, Pimpri Chinchwad, IN;
Hrishikesh Satbhai, Pune, IN;
Vivek Kumar Khetan, San Francisco, CA (US);
Elena Stoyanova Eneva, Sunnyvale, CA (US);
ACCENTURE GLOBAL SOLUTIONS LIMITED, Dublin, IE;
Abstract
Implementations are directed to receiving a plurality of data samples comprising a first set of data samples associated with respective labels and a second set of data samples to be labeled; generating a random forest structure comprising a set of decisions trees, each decision tree including nodes corresponding to the first set of data samples; adding the second set of data samples into each decision tree as additional nodes of each decision tree; merging the set of decision trees to obtain a universal graph, wherein each node corresponds to a data sample; extracting, using a graph embedding algorithm, an embedding feature for each data sample that corresponds to each node included in the universal graph; determining a distance between any pair of two data samples using respective embedding features of the two data samples; and determining a label for each of the second set of data samples using the distance.