The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Jun. 08, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Dharmashankar Subramanian, White Plains, NY (US);

Tian Gao, Berkeley Heights, NJ (US);

Karthikeyan Shanmugam, Elmsford, NY (US);

Debarun Bhattacharjya, New York, NY (US);

Nicholas Scott Mattei, New Orleans, LA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/044 (2023.01); G06N 3/045 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06N 3/044 (2023.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01);
Abstract

A computer-implemented method is presented for learning relationships between multiple event types by employing a multi-channel neural graphical event model (MCN-GEM). The method includes receiving, by a computing device, time-stamped, asynchronous, irregularly spaced event epochs, generating, by the computing device, at least one fake epoch between each inter-event interval, wherein fake epochs represent negative evidence, feeding the event epochs and the at least one fake epoch into long short term memory (LSTM) cells, computing hidden states for each of the event epochs and the at least one fake epoch, feeding the hidden states into spatial and temporal attention models, and employing an average attention across all event epochs to generate causal graphs representing causal relationships between all the event epochs.


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