The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Feb. 04, 2020
Oxford University Innovation Limited, Oxford, GB;
Evan Hann, Oxford, GB;
Stefan Piechnik, Oxford, GB;
Iulia Andreia Popescu, Oxford, GB;
Qiang Zhang, Oxford, GB;
Konrad Werys, Oxford, GB;
Vanessa Ferreira, Oxford, GB;
OXFORD UNIVERSITY INNOVATION LIMITED, Oxford, GB;
Abstract
A method of selecting an operation for analysis of data, the method comprising: processing the data using at least two operations, wherein each of the at least two operations are different, to obtain a set of outputs including the output associated with each operation; determining an output from the set of outputs with the highest predicted accuracy; and selecting the operation associated with the determined output for further analysis of data; wherein the determination of the output with the highest predicted accuracy comprises: selecting an output from the set of outputs; calculating a degree of similarity between the selected output and another output of the set of outputs; using the degree of similarity to predict the accuracy of the selected output based on a relationship between the similarity of the outputs and the accuracy of the outputs, the relationship being derived from an analysis of the degrees of similarity between the outputs of the operations on training data including ground truth and the accuracy of each output compared to the ground truth; selecting a further output from the set of outputs; calculating a further degree of similarity between the selected further output and another output of the set of outputs; using the further degree of similarity to predict the accuracy of the further selected output based on the relationship; and determining the output with the highest predicted accuracy of the selected outputs.