The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Feb. 24, 2023
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Jun Kanai, Inagi Tokyo, JP;

Tatsuya Uehara, Kawasaki Kanagawa, JP;

Ryuiti Koike, Kawasaki Kanagawa, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01);
Abstract

According to one embodiment, a risk evaluation device includes a vulnerability information input unit, an individual countermeasure acquisition unit, a parameter acquisition unit, a determination unit, and a calculation unit. The vulnerability information input unit receives an input of vulnerability information to be subjected to risk evaluation. The individual countermeasure acquisition unit acquires at least one security countermeasure introduced into a system to be evaluated. The parameter acquisition unit acquires a candidate parameter value to be used for calculation of the risk of vulnerability for each security countermeasure based on the security countermeasure and the vulnerability information. The determination unit determines a parameter to be used for the calculation of the risk of vulnerability from the candidate parameter values. The calculation unit calculates a risk value indicating the risk of vulnerability by using the parameters determined by the determination unit.


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